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1 article(s) from Rode, Sebastian

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

Jannis Lübbe,
Matthias Temmen,
Sebastian Rode,
Philipp Rahe,
Angelika Kühnle and
Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

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Figure 1: Schematic representation of the signal path in an NC-AFM system based on optical beam deflection wi...

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Figure 2: Illustrative representation for the spectral density of the displacement of a cantilever excited to...

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Figure 3: Illustrative representation of noise properties for a cantilever with f₀ = 70 kHz, k = 2.5 N/m and Q...

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Figure 4: Illustrative representation of the noise spectral density for the total frequency-shift noise [Graphic 53] = [Graphic 32] f...

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Figure 5: Frequency response of the high-bandwidth preamplifier (bandwidth 3.1 MHz) and the low-bandwidth pre...

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Figure 6: Measured and modelled noise figures for system C. (a) Different levels of displacement noise spectr...

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Figure 7: (a) Measured (solid) and modelled (dashed) frequency-shift-noise spectral density [Graphic 56] using three diff...

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Figure 8: (a) RMS frequency-shift noise δf and (b) normalised RMS frequency-shift noise δγ in the limit of pu...

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Full Research Paper

Published 17 Jan 2013

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